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For routine characterization of MBE-grown thin films of transition metal oxides and dichalcogenides, we require an x-ray system for high-resolution x-ray diffraction which fulfills the following requirements. The instrument will be used to characterize crystallographic structure, composition, thickness, strain/relaxation and quality of thin films and heterostructures of transition metal oxides and chalcogenides as well as of single crystals, organic thin films, and others.
| Supplier | Identifier | Award Value | Lots Won | Cross-References |
|---|---|---|---|---|
| Bruker UK | 00923986 | ~£230,000 estimated from lot values | 1 lot Lot 1 | - |
This procurement was divided into 1 lots, each awarded separately. 3 bids were received in total.
| Lot | Value | Bids Received | Awarded To | Status |
|---|---|---|---|---|
| Lot 1 180 days | £230,000 £249,954 initial term | 3 | Bruker UK | complete |
Weightings from the notice.
Government spending data: This supplier has received £6,024,983 in 137 payments (over £25k) from DEFRA, UK Health Security Agency, UKRI, Ministry of Defence, Maidstone and Tunbridge Wells NHS Trust and 20 more public bodies (2016-04-12 to 2026-05-11). View full payment history →
Published by the buyer on this notice. Check the original notice — details change and are not updated here.