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NOTE: This notice was updated on 23 November 2023 for the following reason: Please note that the deadline for submissions has been extended to Friday, December 1st, 2023.(The university is looking to purchase a focused ion beam secondary electron microscope (FIB-SEM) that can handle various samples from different fields including semiconductors, energy materials (such as batteries and photovoltaics), civil engineering, metallurgy, etc. The instrument must excel in analysing thin film multilayer structures and devices (e.g. thin film solar cells), which typically consist of layers ranging from 1 micron to less than 20nm thick, requiring 3-dimensional microstructure analysis. The instrument must have excellent imaging capabilities, as well as the ability to handle Energy Dispersive X-ray Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD) investigations. We also require a TOF-SIMS detector and electron beam-induced current (EBIC) electronics.)
No supplier information available.